Bitcoin Core  0.20.99
P2P Digital Currency
Classes | Macros | Functions | Variables
tests.c File Reference
#include <stdio.h>
#include <stdlib.h>
#include <string.h>
#include <time.h>
#include "secp256k1.c"
#include "include/secp256k1.h"
#include "testrand_impl.h"
#include "contrib/lax_der_parsing.c"
#include "contrib/lax_der_privatekey_parsing.c"
Include dependency graph for tests.c:

Go to the source code of this file.

Classes

struct  ecmult_multi_data
 

Macros

#define VG_UNDEF(x, y)
 
#define VG_CHECK(x, y)
 
#define SECP256K1_EC_PARSE_TEST_NVALID   (12)
 
#define SECP256K1_EC_PARSE_TEST_NXVALID   (4)
 
#define SECP256K1_EC_PARSE_TEST_NINVALID   (7)
 

Functions

static void counting_illegal_callback_fn (const char *str, void *data)
 
static void uncounting_illegal_callback_fn (const char *str, void *data)
 
void random_field_element_test (secp256k1_fe *fe)
 
void random_field_element_magnitude (secp256k1_fe *fe)
 
void random_group_element_test (secp256k1_ge *ge)
 
void random_group_element_jacobian_test (secp256k1_gej *gej, const secp256k1_ge *ge)
 
void random_scalar_order_test (secp256k1_scalar *num)
 
void random_scalar_order (secp256k1_scalar *num)
 
void run_context_tests (void)
 
void run_scratch_tests (void)
 
void run_sha256_tests (void)
 
void run_hmac_sha256_tests (void)
 
void run_rfc6979_hmac_sha256_tests (void)
 
void test_rand_bits (int rand32, int bits)
 
void test_rand_int (uint32_t range, uint32_t subrange)
 
void run_rand_bits (void)
 
void run_rand_int (void)
 
void random_num_negate (secp256k1_num *num)
 
void random_num_order_test (secp256k1_num *num)
 
void random_num_order (secp256k1_num *num)
 
void test_num_negate (void)
 
void test_num_add_sub (void)
 
void test_num_mod (void)
 
void test_num_jacobi (void)
 
void run_num_smalltests (void)
 
void scalar_test (void)
 
void run_scalar_tests (void)
 
void random_fe (secp256k1_fe *x)
 
void random_fe_test (secp256k1_fe *x)
 
void random_fe_non_zero (secp256k1_fe *nz)
 
void random_fe_non_square (secp256k1_fe *ns)
 
int check_fe_equal (const secp256k1_fe *a, const secp256k1_fe *b)
 
int check_fe_inverse (const secp256k1_fe *a, const secp256k1_fe *ai)
 
void run_field_convert (void)
 
int fe_memcmp (const secp256k1_fe *a, const secp256k1_fe *b)
 
void run_field_misc (void)
 
void run_field_inv (void)
 
void run_field_inv_var (void)
 
void run_field_inv_all_var (void)
 
void run_sqr (void)
 
void test_sqrt (const secp256k1_fe *a, const secp256k1_fe *k)
 
void run_sqrt (void)
 
void ge_equals_ge (const secp256k1_ge *a, const secp256k1_ge *b)
 
int gej_xyz_equals_gej (const secp256k1_gej *a, const secp256k1_gej *b)
 
void ge_equals_gej (const secp256k1_ge *a, const secp256k1_gej *b)
 
void test_ge (void)
 
void test_add_neg_y_diff_x (void)
 
void run_ge (void)
 
void test_ec_combine (void)
 
void run_ec_combine (void)
 
void test_group_decompress (const secp256k1_fe *x)
 
void run_group_decompress (void)
 
void run_ecmult_chain (void)
 
void test_point_times_order (const secp256k1_gej *point)
 
void run_point_times_order (void)
 
void ecmult_const_random_mult (void)
 
void ecmult_const_commutativity (void)
 
void ecmult_const_mult_zero_one (void)
 
void ecmult_const_chain_multiply (void)
 
void run_ecmult_const_tests (void)
 
static int ecmult_multi_callback (secp256k1_scalar *sc, secp256k1_ge *pt, size_t idx, void *cbdata)
 
static int ecmult_multi_false_callback (secp256k1_scalar *sc, secp256k1_ge *pt, size_t idx, void *cbdata)
 
void test_ecmult_multi (secp256k1_scratch *scratch, secp256k1_ecmult_multi_func ecmult_multi)
 
void test_secp256k1_pippenger_bucket_window_inv (void)
 
void test_ecmult_multi_pippenger_max_points (void)
 Probabilistically test the function returning the maximum number of possible points for a given scratch space. More...
 
void test_ecmult_multi_batch_size_helper (void)
 
void test_ecmult_multi_batching (void)
 Run secp256k1_ecmult_multi_var with num points and a scratch space restricted to 1 <= i <= num points. More...
 
void run_ecmult_multi_tests (void)
 
void test_wnaf (const secp256k1_scalar *number, int w)
 
void test_constant_wnaf_negate (const secp256k1_scalar *number)
 
void test_constant_wnaf (const secp256k1_scalar *number, int w)
 
void test_fixed_wnaf (const secp256k1_scalar *number, int w)
 
void test_fixed_wnaf_small_helper (int *wnaf, int *wnaf_expected, int w)
 
void test_fixed_wnaf_small (void)
 
void run_wnaf (void)
 
void test_ecmult_constants (void)
 
void run_ecmult_constants (void)
 
void test_ecmult_gen_blind (void)
 
void test_ecmult_gen_blind_reset (void)
 
void run_ecmult_gen_blind (void)
 
void ec_pubkey_parse_pointtest (const unsigned char *input, int xvalid, int yvalid)
 
void run_ec_pubkey_parse_test (void)
 
void run_eckey_edge_case_test (void)
 
void random_sign (secp256k1_scalar *sigr, secp256k1_scalar *sigs, const secp256k1_scalar *key, const secp256k1_scalar *msg, int *recid)
 
void test_ecdsa_sign_verify (void)
 
void run_ecdsa_sign_verify (void)
 
static int precomputed_nonce_function (unsigned char *nonce32, const unsigned char *msg32, const unsigned char *key32, const unsigned char *algo16, void *data, unsigned int counter)
 Dummy nonce generation function that just uses a precomputed nonce, and fails if it is not accepted. More...
 
static int nonce_function_test_fail (unsigned char *nonce32, const unsigned char *msg32, const unsigned char *key32, const unsigned char *algo16, void *data, unsigned int counter)
 
static int nonce_function_test_retry (unsigned char *nonce32, const unsigned char *msg32, const unsigned char *key32, const unsigned char *algo16, void *data, unsigned int counter)
 
int is_empty_signature (const secp256k1_ecdsa_signature *sig)
 
void test_ecdsa_end_to_end (void)
 
void test_random_pubkeys (void)
 
void run_random_pubkeys (void)
 
void run_ecdsa_end_to_end (void)
 
int test_ecdsa_der_parse (const unsigned char *sig, size_t siglen, int certainly_der, int certainly_not_der)
 
static void assign_big_endian (unsigned char *ptr, size_t ptrlen, uint32_t val)
 
static void damage_array (unsigned char *sig, size_t *len)
 
static void random_ber_signature (unsigned char *sig, size_t *len, int *certainly_der, int *certainly_not_der)
 
void run_ecdsa_der_parse (void)
 
void test_ecdsa_edge_cases (void)
 
void run_ecdsa_edge_cases (void)
 
int main (int argc, char **argv)
 

Variables

static int count = 64
 
static secp256k1_contextctx = NULL
 

Macro Definition Documentation

◆ SECP256K1_EC_PARSE_TEST_NINVALID

#define SECP256K1_EC_PARSE_TEST_NINVALID   (7)

◆ SECP256K1_EC_PARSE_TEST_NVALID

#define SECP256K1_EC_PARSE_TEST_NVALID   (12)

◆ SECP256K1_EC_PARSE_TEST_NXVALID

#define SECP256K1_EC_PARSE_TEST_NXVALID   (4)

◆ VG_CHECK

#define VG_CHECK (   x,
 
)

Definition at line 41 of file tests.c.

◆ VG_UNDEF

#define VG_UNDEF (   x,
 
)

Definition at line 40 of file tests.c.

Function Documentation

◆ assign_big_endian()

static void assign_big_endian ( unsigned char *  ptr,
size_t  ptrlen,
uint32_t  val 
)
static

Definition at line 4365 of file tests.c.

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◆ check_fe_equal()

int check_fe_equal ( const secp256k1_fe a,
const secp256k1_fe b 
)

Definition at line 1639 of file tests.c.

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◆ check_fe_inverse()

int check_fe_inverse ( const secp256k1_fe a,
const secp256k1_fe ai 
)

Definition at line 1647 of file tests.c.

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◆ counting_illegal_callback_fn()

static void counting_illegal_callback_fn ( const char *  str,
void *  data 
)
static

Definition at line 48 of file tests.c.

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◆ damage_array()

static void damage_array ( unsigned char *  sig,
size_t *  len 
)
static

Definition at line 4377 of file tests.c.

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◆ ec_pubkey_parse_pointtest()

void ec_pubkey_parse_pointtest ( const unsigned char *  input,
int  xvalid,
int  yvalid 
)

Definition at line 3318 of file tests.c.

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◆ ecmult_const_chain_multiply()

void ecmult_const_chain_multiply ( void  )

Definition at line 2514 of file tests.c.

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◆ ecmult_const_commutativity()

void ecmult_const_commutativity ( void  )

Definition at line 2471 of file tests.c.

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◆ ecmult_const_mult_zero_one()

void ecmult_const_mult_zero_one ( void  )

Definition at line 2492 of file tests.c.

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◆ ecmult_const_random_mult()

void ecmult_const_random_mult ( void  )

Definition at line 2444 of file tests.c.

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◆ ecmult_multi_callback()

static int ecmult_multi_callback ( secp256k1_scalar sc,
secp256k1_ge pt,
size_t  idx,
void *  cbdata 
)
static

Definition at line 2552 of file tests.c.

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◆ ecmult_multi_false_callback()

static int ecmult_multi_false_callback ( secp256k1_scalar sc,
secp256k1_ge pt,
size_t  idx,
void *  cbdata 
)
static

Definition at line 2559 of file tests.c.

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◆ fe_memcmp()

int fe_memcmp ( const secp256k1_fe a,
const secp256k1_fe b 
)

Definition at line 1684 of file tests.c.

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◆ ge_equals_ge()

void ge_equals_ge ( const secp256k1_ge a,
const secp256k1_ge b 
)

Definition at line 1877 of file tests.c.

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◆ ge_equals_gej()

void ge_equals_gej ( const secp256k1_ge a,
const secp256k1_gej b 
)

Definition at line 1908 of file tests.c.

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◆ gej_xyz_equals_gej()

int gej_xyz_equals_gej ( const secp256k1_gej a,
const secp256k1_gej b 
)

Definition at line 1887 of file tests.c.

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◆ is_empty_signature()

int is_empty_signature ( const secp256k1_ecdsa_signature sig)

Definition at line 4041 of file tests.c.

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◆ main()

int main ( int  argc,
char **  argv 
)

Definition at line 5019 of file tests.c.

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◆ nonce_function_test_fail()

static int nonce_function_test_fail ( unsigned char *  nonce32,
const unsigned char *  msg32,
const unsigned char *  key32,
const unsigned char *  algo16,
void *  data,
unsigned int  counter 
)
static

Definition at line 4003 of file tests.c.

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◆ nonce_function_test_retry()

static int nonce_function_test_retry ( unsigned char *  nonce32,
const unsigned char *  msg32,
const unsigned char *  key32,
const unsigned char *  algo16,
void *  data,
unsigned int  counter 
)
static

Definition at line 4011 of file tests.c.

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◆ precomputed_nonce_function()

static int precomputed_nonce_function ( unsigned char *  nonce32,
const unsigned char *  msg32,
const unsigned char *  key32,
const unsigned char *  algo16,
void *  data,
unsigned int  counter 
)
static

Dummy nonce generation function that just uses a precomputed nonce, and fails if it is not accepted.

Use only for testing.

Definition at line 3995 of file tests.c.

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◆ random_ber_signature()

static void random_ber_signature ( unsigned char *  sig,
size_t *  len,
int *  certainly_der,
int *  certainly_not_der 
)
static

Definition at line 4404 of file tests.c.

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◆ random_fe()

void random_fe ( secp256k1_fe x)

Definition at line 1598 of file tests.c.

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◆ random_fe_non_square()

void random_fe_non_square ( secp256k1_fe ns)

Definition at line 1631 of file tests.c.

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◆ random_fe_non_zero()

void random_fe_non_zero ( secp256k1_fe nz)

Definition at line 1618 of file tests.c.

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◆ random_fe_test()

void random_fe_test ( secp256k1_fe x)

Definition at line 1608 of file tests.c.

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◆ random_field_element_magnitude()

void random_field_element_magnitude ( secp256k1_fe fe)

Definition at line 74 of file tests.c.

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◆ random_field_element_test()

void random_field_element_test ( secp256k1_fe fe)

Definition at line 64 of file tests.c.

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◆ random_group_element_jacobian_test()

void random_group_element_jacobian_test ( secp256k1_gej gej,
const secp256k1_ge ge 
)

Definition at line 99 of file tests.c.

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◆ random_group_element_test()

void random_group_element_test ( secp256k1_ge ge)

Definition at line 88 of file tests.c.

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◆ random_num_negate()

void random_num_negate ( secp256k1_num num)

Definition at line 494 of file tests.c.

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◆ random_num_order()

void random_num_order ( secp256k1_num num)

Definition at line 506 of file tests.c.

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◆ random_num_order_test()

void random_num_order_test ( secp256k1_num num)

Definition at line 500 of file tests.c.

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◆ random_scalar_order()

void random_scalar_order ( secp256k1_scalar num)

Definition at line 127 of file tests.c.

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◆ random_scalar_order_test()

void random_scalar_order_test ( secp256k1_scalar num)

Definition at line 114 of file tests.c.

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◆ random_sign()

void random_sign ( secp256k1_scalar sigr,
secp256k1_scalar sigs,
const secp256k1_scalar key,
const secp256k1_scalar msg,
int *  recid 
)

Definition at line 3957 of file tests.c.

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◆ run_context_tests()

void run_context_tests ( void  )

Definition at line 140 of file tests.c.

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◆ run_ec_combine()

void run_ec_combine ( void  )

Definition at line 2241 of file tests.c.

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◆ run_ec_pubkey_parse_test()

void run_ec_pubkey_parse_test ( void  )

Definition at line 3393 of file tests.c.

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◆ run_ecdsa_der_parse()

void run_ecdsa_der_parse ( void  )

Definition at line 4550 of file tests.c.

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◆ run_ecdsa_edge_cases()

void run_ecdsa_edge_cases ( void  )

Definition at line 4951 of file tests.c.

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◆ run_ecdsa_end_to_end()

void run_ecdsa_end_to_end ( void  )

Definition at line 4244 of file tests.c.

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◆ run_ecdsa_sign_verify()

void run_ecdsa_sign_verify ( void  )

Definition at line 3987 of file tests.c.

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◆ run_eckey_edge_case_test()

void run_eckey_edge_case_test ( void  )

Definition at line 3721 of file tests.c.

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◆ run_ecmult_chain()

void run_ecmult_chain ( void  )

Definition at line 2323 of file tests.c.

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◆ run_ecmult_const_tests()

void run_ecmult_const_tests ( void  )

Definition at line 2540 of file tests.c.

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◆ run_ecmult_constants()

void run_ecmult_constants ( void  )

Definition at line 3241 of file tests.c.

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◆ run_ecmult_gen_blind()

void run_ecmult_gen_blind ( void  )

Definition at line 3280 of file tests.c.

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◆ run_ecmult_multi_tests()

void run_ecmult_multi_tests ( void  )

Definition at line 2966 of file tests.c.

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◆ run_field_convert()

void run_field_convert ( void  )

Definition at line 1654 of file tests.c.

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◆ run_field_inv()

void run_field_inv ( void  )

Definition at line 1765 of file tests.c.

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◆ run_field_inv_all_var()

void run_field_inv_all_var ( void  )

Definition at line 1789 of file tests.c.

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◆ run_field_inv_var()

void run_field_inv_var ( void  )

Definition at line 1777 of file tests.c.

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◆ run_field_misc()

void run_field_misc ( void  )

Definition at line 1693 of file tests.c.

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◆ run_ge()

void run_ge ( void  )

Definition at line 2208 of file tests.c.

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◆ run_group_decompress()

void run_group_decompress ( void  )

Definition at line 2312 of file tests.c.

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◆ run_hmac_sha256_tests()

void run_hmac_sha256_tests ( void  )

Definition at line 334 of file tests.c.

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◆ run_num_smalltests()

void run_num_smalltests ( void  )

Definition at line 666 of file tests.c.

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◆ run_point_times_order()

void run_point_times_order ( void  )

Definition at line 2422 of file tests.c.

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◆ run_rand_bits()

void run_rand_bits ( void  )

Definition at line 472 of file tests.c.

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◆ run_rand_int()

void run_rand_int ( void  )

Definition at line 480 of file tests.c.

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◆ run_random_pubkeys()

void run_random_pubkeys ( void  )

Definition at line 4237 of file tests.c.

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◆ run_rfc6979_hmac_sha256_tests()

void run_rfc6979_hmac_sha256_tests ( void  )

Definition at line 378 of file tests.c.

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◆ run_scalar_tests()

void run_scalar_tests ( void  )

Definition at line 968 of file tests.c.

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◆ run_scratch_tests()

void run_scratch_tests ( void  )

Definition at line 258 of file tests.c.

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◆ run_sha256_tests()

void run_sha256_tests ( void  )

Definition at line 298 of file tests.c.

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◆ run_sqr()

void run_sqr ( void  )

Definition at line 1811 of file tests.c.

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◆ run_sqrt()

void run_sqrt ( void  )

Definition at line 1841 of file tests.c.

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◆ run_wnaf()

void run_wnaf ( void  )

Definition at line 3181 of file tests.c.

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◆ scalar_test()

void scalar_test ( void  )

Definition at line 679 of file tests.c.

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◆ test_add_neg_y_diff_x()

void test_add_neg_y_diff_x ( void  )

Definition at line 2141 of file tests.c.

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◆ test_constant_wnaf()

void test_constant_wnaf ( const secp256k1_scalar number,
int  w 
)

Definition at line 3036 of file tests.c.

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◆ test_constant_wnaf_negate()

void test_constant_wnaf_negate ( const secp256k1_scalar number)

Definition at line 3021 of file tests.c.

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◆ test_ec_combine()

void test_ec_combine ( void  )

Definition at line 2216 of file tests.c.

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◆ test_ecdsa_der_parse()

int test_ecdsa_der_parse ( const unsigned char *  sig,
size_t  siglen,
int  certainly_der,
int  certainly_not_der 
)

Definition at line 4251 of file tests.c.

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◆ test_ecdsa_edge_cases()

void test_ecdsa_edge_cases ( void  )

Definition at line 4582 of file tests.c.

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◆ test_ecdsa_end_to_end()

void test_ecdsa_end_to_end ( void  )

Definition at line 4046 of file tests.c.

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◆ test_ecdsa_sign_verify()

void test_ecdsa_sign_verify ( void  )

Definition at line 3964 of file tests.c.

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◆ test_ecmult_constants()

void test_ecmult_constants ( void  )

Definition at line 3208 of file tests.c.

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◆ test_ecmult_gen_blind()

void test_ecmult_gen_blind ( void  )

Definition at line 3245 of file tests.c.

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◆ test_ecmult_gen_blind_reset()

void test_ecmult_gen_blind_reset ( void  )

Definition at line 3268 of file tests.c.

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◆ test_ecmult_multi()

void test_ecmult_multi ( secp256k1_scratch scratch,
secp256k1_ecmult_multi_func  ecmult_multi 
)

Definition at line 2567 of file tests.c.

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◆ test_ecmult_multi_batch_size_helper()

void test_ecmult_multi_batch_size_helper ( void  )

Definition at line 2857 of file tests.c.

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◆ test_ecmult_multi_batching()

void test_ecmult_multi_batching ( void  )

Run secp256k1_ecmult_multi_var with num points and a scratch space restricted to 1 <= i <= num points.

Definition at line 2905 of file tests.c.

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◆ test_ecmult_multi_pippenger_max_points()

void test_ecmult_multi_pippenger_max_points ( void  )

Probabilistically test the function returning the maximum number of possible points for a given scratch space.

Definition at line 2834 of file tests.c.

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◆ test_fixed_wnaf()

void test_fixed_wnaf ( const secp256k1_scalar number,
int  w 
)

Definition at line 3077 of file tests.c.

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◆ test_fixed_wnaf_small()

void test_fixed_wnaf_small ( void  )

Definition at line 3127 of file tests.c.

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◆ test_fixed_wnaf_small_helper()

void test_fixed_wnaf_small_helper ( int *  wnaf,
int *  wnaf_expected,
int  w 
)

Definition at line 3117 of file tests.c.

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◆ test_ge()

void test_ge ( void  )

Definition at line 1925 of file tests.c.

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◆ test_group_decompress()

void test_group_decompress ( const secp256k1_fe x)

Definition at line 2248 of file tests.c.

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◆ test_num_add_sub()

void test_num_add_sub ( void  )

Definition at line 532 of file tests.c.

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◆ test_num_jacobi()

void test_num_jacobi ( void  )

test large values with 5 as group order

test with secp group order as order

Definition at line 605 of file tests.c.

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◆ test_num_mod()

void test_num_mod ( void  )

Definition at line 574 of file tests.c.

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◆ test_num_negate()

void test_num_negate ( void  )

Definition at line 512 of file tests.c.

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◆ test_point_times_order()

void test_point_times_order ( const secp256k1_gej point)

Definition at line 2387 of file tests.c.

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◆ test_rand_bits()

void test_rand_bits ( int  rand32,
int  bits 
)

Definition at line 421 of file tests.c.

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◆ test_rand_int()

void test_rand_int ( uint32_t  range,
uint32_t  subrange 
)

Definition at line 456 of file tests.c.

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◆ test_random_pubkeys()

void test_random_pubkeys ( void  )

Definition at line 4177 of file tests.c.

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◆ test_secp256k1_pippenger_bucket_window_inv()

void test_secp256k1_pippenger_bucket_window_inv ( void  )

Definition at line 2812 of file tests.c.

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◆ test_sqrt()

void test_sqrt ( const secp256k1_fe a,
const secp256k1_fe k 
)

Definition at line 1827 of file tests.c.

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◆ test_wnaf()

void test_wnaf ( const secp256k1_scalar number,
int  w 
)

Definition at line 2987 of file tests.c.

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◆ uncounting_illegal_callback_fn()

static void uncounting_illegal_callback_fn ( const char *  str,
void *  data 
)
static

Definition at line 56 of file tests.c.

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Variable Documentation

◆ count

int count = 64
static

Definition at line 45 of file tests.c.

◆ ctx

secp256k1_context* ctx = NULL
static

Definition at line 46 of file tests.c.